{"created":"2023-07-25T11:04:38.456935+00:00","id":7794,"links":{},"metadata":{"_buckets":{"deposit":"fb2b5227-7415-407c-8702-2165929dd2fa"},"_deposit":{"created_by":4,"id":"7794","owners":[4],"pid":{"revision_id":0,"type":"depid","value":"7794"},"status":"published"},"_oai":{"id":"oai:nipr.repo.nii.ac.jp:00007794","sets":["1259:906:958"]},"author_link":["10274","12452","12623","12617","10916","10918"],"item_1_alternative_title_5":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_alternative_title":"GLASS-SEALD LAMGMIR PROBE オヨビ ELECTRON TEMPEATURE PROBE ニヨル キョクイキ デンリソウ ノ カンソク デンシ ミツド・オンド ノ ソクイテイ"}]},"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1975-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"91","bibliographicPageStart":"78","bibliographicVolumeNumber":"52","bibliographic_titles":[{"bibliographic_title":"南極資料"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小山, 孝一郎"},{"creatorName":"オヤマ, コウイチロウ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"平尾, 邦雄"},{"creatorName":"ヒラオ, クニオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"宮崎, 茂"},{"creatorName":"ミヤザキ, シゲル","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]}]},"item_1_creator_8":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"OYAMA, Koichiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"HIRAO, Kunio","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MIYAZAKI, Shigeru","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_11":{"attribute_name":"抄録(日)","attribute_value_mlt":[{"subitem_description":"DCラングミュアプローブによる電離層電子密度・温度の測定において,電極表面の汚染の影響は,まず第一に留意しなければならない.本論文では,この電極汚染の影響をさけて信頼し得るデータを得るために開発されたガラス封入型DCラングミュアプロ-ブ(Glass-sealed Langmuir probe),および電子温度プローブ(Electron temperature probe)について概説し,あわせて,極域電離層研究への応用の可能性をさぐる.","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"In plasma diagnosis by means of a Langmuir probe, contamination of the electrode is a quite serious problem. In order to get reliable data of space plasma, cleaning of the electrode is an essential requirement. The instrument which is not influenced by the electrode contamination must be developed. In this paper we recommend two types of probes; one is a glass-sealed Langmuir probe and the other is an electron temperature probe. These two probes are free from contaminaton effects and can give reliable electron density and temperature in the ionospheric plasma. Finally this paper briefly discusses the application of the Langmuir probe to polar ionosphere study.","subitem_description_type":"Other"}]},"item_1_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.15094/00007794","subitem_identifier_reg_type":"JaLC"}]},"item_1_publisher_22":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"国立極地研究所"}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00181831","subitem_source_identifier_type":"NCID"}]},"item_1_source_id_20":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00857289","subitem_source_identifier_type":"ISSN"}]},"item_1_subject_21":{"attribute_name":"国際十進分類法","attribute_value_mlt":[{"subitem_subject":"551.510.535/.537","subitem_subject_scheme":"UDC"}]},"item_1_text_10":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Institute of Space and Aeronautical Science, University of Tokyo"},{"subitem_text_language":"en","subitem_text_value":"Institute of Space and Aeronautical Science, University of Tokyo"},{"subitem_text_language":"en","subitem_text_value":"Radio Research Laboratory"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"東京大学宇宙航空研究所"},{"subitem_text_value":"東京大学宇宙航空研究所"},{"subitem_text_value":"郵政省電波研究所"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"1975-03-01"}],"displaytype":"detail","filename":"KJ00002476794.pdf","filesize":[{"value":"4.5 MB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"KJ00002476794","url":"https://nipr.repo.nii.ac.jp/record/7794/files/KJ00002476794.pdf"},"version_id":"96b9eb04-c752-40bb-9dd6-56330e00ad4e"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定"},{"subitem_title":"Measurement of Electron Density and Temperature by Means of Contamination-Free Probe","subitem_title_language":"en"}]},"item_type_id":"1","owner":"4","path":["958"],"pubdate":{"attribute_name":"公開日","attribute_value":"1975-03-01"},"publish_date":"1975-03-01","publish_status":"0","recid":"7794","relation_version_is_last":true,"title":["Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定"],"weko_creator_id":"4","weko_shared_id":4},"updated":"2023-07-25T11:52:14.756733+00:00"}