@article{oai:nipr.repo.nii.ac.jp:00007794,
 author = {小山, 孝一郎 and 平尾, 邦雄 and 宮崎, 茂 and OYAMA, Koichiro and HIRAO, Kunio and MIYAZAKI, Shigeru},
 journal = {南極資料},
 month = {Mar},
 note = {P(論文), DCラングミュアプローブによる電離層電子密度・温度の測定において,電極表面の汚染の影響は,まず第一に留意しなければならない.本論文では,この電極汚染の影響をさけて信頼し得るデータを得るために開発されたガラス封入型DCラングミュアプロ-ブ(Glass-sealed Langmuir probe),および電子温度プローブ(Electron temperature probe)について概説し,あわせて,極域電離層研究への応用の可能性をさぐる., In plasma diagnosis by means of a Langmuir probe, contamination of the electrode is a quite serious problem. In order to get reliable data of space plasma, cleaning of the electrode is an essential requirement. The instrument which is not influenced by the electrode contamination must be developed. In this paper we recommend two types of probes; one is a glass-sealed Langmuir probe and the other is an electron temperature probe. These two probes are free from contaminaton effects and can give reliable electron density and temperature in the ionospheric plasma. Finally this paper briefly discusses the application of the Langmuir probe to polar ionosphere study.},
 pages = {78--91},
 title = {Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定},
 volume = {52},
 year = {1975},
 yomi = {オヤマ, コウイチロウ and ヒラオ, クニオ and ミヤザキ, シゲル}
}