{"created":"2023-07-25T11:01:02.020065+00:00","id":2936,"links":{},"metadata":{"_buckets":{"deposit":"708dc386-23de-4b34-bf6d-a6f2b5c6fd02"},"_deposit":{"created_by":4,"id":"2936","owners":[4],"pid":{"revision_id":0,"type":"depid","value":"2936"},"status":"published"},"_oai":{"id":"oai:nipr.repo.nii.ac.jp:00002936","sets":["1259:1260:1262:425:429"]},"author_link":["4299","4304","4302","4307","4301","4305","4300","4298","4306","4303"],"item_1_alternative_title_5":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_alternative_title":"Application of He-microwave induced plasma atomic emission spectroscopy to an analysis of individual particulate matter"}]},"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-11","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"132","bibliographicPageStart":"124","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"Polar meteorology and glaciology"}]}]},"item_1_creator_7":{"attribute_name":"著者名よみ","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"タムラ, サナエ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"キクチ, タダシ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"タカハラ, ヒサオ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"ミシマ, ミナコ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"フジイ, ヨシユキ"}],"nameIdentifiers":[{}]}]},"item_1_creator_8":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tamura, Sanae","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kikuchi, Tadashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahara, Hisao","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mishima, Minako","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fujii, Yoshiyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"He-microwave induced plasma atomic emission spectroscopy (He-MIP-AES) (H. Takahara, Ultra Clean Technol., 5,310,1993) has been used for the characterization of individual micro-particles. The GSJ (Geological Survey of Japan) geochemical reference samples, JB-la (basalt, Sasebo, Nagasaki Prefecture), JB-3 (basalt, Mt. Fuji, Yamanashi Prefecture), and JR-1 (rhyolite, Wada Pass, Nagano Prefecture) were analyzed by He-MIP-AES. The major elements, Si, Fe, Ca, and Mg, and the minor elements, Cr and Ni, in these rock reference samples were chosen for analysis. We have directed our attention to the elemental compositions found from the correlation of simultaneous emissions especially. The JB-1a and JB-3 showed different characteristic correlation of simultaneous emissions between Fe and Mg, even though both of them are classified as basalt. This suggests that we can characterize micro-particles by measuring the correlation of simultaneous emissions for individual particles and analyzing the distinctive features of their correlation for all particles. Namely, the He-MIP-AES technique should be applicable for the identification of individual particulate matter, such as tephra particles.","subitem_description_type":"Other"}]},"item_1_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.15094/00002936","subitem_identifier_reg_type":"JaLC"}]},"item_1_publisher_22":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"National Institute of Polar Research"}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AA1129795X","subitem_source_identifier_type":"NCID"}]},"item_1_text_10":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Faculty of Science and Engineering, Science University of Tokyo in Yamaguchi"},{"subitem_text_language":"en","subitem_text_value":"Faculty of Science and Engineering, Science University of Tokyo in Yamaguchi"},{"subitem_text_language":"en","subitem_text_value":"Yokogawa Electric Corporation"},{"subitem_text_language":"en","subitem_text_value":"Yokogawa Electric Corporation"},{"subitem_text_language":"en","subitem_text_value":"National Institute of Polar Research"}]},"item_1_text_3":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Scientific Note"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2001-11-01"}],"displaytype":"detail","filename":"KJ00002364423.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"KJ00002364423","url":"https://nipr.repo.nii.ac.jp/record/2936/files/KJ00002364423.pdf"},"version_id":"f32a7901-6814-4d03-9b88-8e725eae4ce1"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Application of He-microwave induced plasma atomic emission spectroscopy to an analysis of individual particulate matter","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Application of He-microwave induced plasma atomic emission spectroscopy to an analysis of individual particulate matter"}]},"item_type_id":"1","owner":"4","path":["429"],"pubdate":{"attribute_name":"公開日","attribute_value":"2001-11-01"},"publish_date":"2001-11-01","publish_status":"0","recid":"2936","relation_version_is_last":true,"title":["Application of He-microwave induced plasma atomic emission spectroscopy to an analysis of individual particulate matter"],"weko_creator_id":"4","weko_shared_id":4},"updated":"2023-07-25T12:40:17.522116+00:00"}