WEKO3
アイテム
{"_buckets": {"deposit": "fb2b5227-7415-407c-8702-2165929dd2fa"}, "_deposit": {"created_by": 4, "id": "7794", "owners": [4], "pid": {"revision_id": 0, "type": "depid", "value": "7794"}, "status": "published"}, "_oai": {"id": "oai:nipr.repo.nii.ac.jp:00007794", "sets": ["958"]}, "author_link": ["10274", "12452", "12623", "12617", "10916", "10918"], "item_1_alternative_title_5": {"attribute_name": "論文名よみ", "attribute_value_mlt": [{"subitem_alternative_title": "GLASS-SEALD LAMGMIR PROBE オヨビ ELECTRON TEMPEATURE PROBE ニヨル キョクイキ デンリソウ ノ カンソク デンシ ミツド・オンド ノ ソクイテイ"}]}, "item_1_biblio_info_14": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1975-03", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "91", "bibliographicPageStart": "78", "bibliographicVolumeNumber": "52", "bibliographic_titles": [{"bibliographic_title": "南極資料"}]}]}, "item_1_creator_6": {"attribute_name": "著者名(日)", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "小山, 孝一郎"}, {"creatorName": "オヤマ, コウイチロウ", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "12617", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "平尾, 邦雄"}, {"creatorName": "ヒラオ, クニオ", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "10916", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "宮崎, 茂"}, {"creatorName": "ミヤザキ, シゲル", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "12452", "nameIdentifierScheme": "WEKO"}]}]}, "item_1_creator_8": {"attribute_name": "著者名(英)", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "OYAMA, Koichiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "12623", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "HIRAO, Kunio", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "10918", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "MIYAZAKI, Shigeru", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "10274", "nameIdentifierScheme": "WEKO"}]}]}, "item_1_description_1": {"attribute_name": "ページ属性", "attribute_value_mlt": [{"subitem_description": "P(論文)", "subitem_description_type": "Other"}]}, "item_1_description_11": {"attribute_name": "抄録(日)", "attribute_value_mlt": [{"subitem_description": "DCラングミュアプローブによる電離層電子密度・温度の測定において,電極表面の汚染の影響は,まず第一に留意しなければならない.本論文では,この電極汚染の影響をさけて信頼し得るデータを得るために開発されたガラス封入型DCラングミュアプロ-ブ(Glass-sealed Langmuir probe),および電子温度プローブ(Electron temperature probe)について概説し,あわせて,極域電離層研究への応用の可能性をさぐる.", "subitem_description_type": "Other"}]}, "item_1_description_12": {"attribute_name": "抄録(英)", "attribute_value_mlt": [{"subitem_description": "In plasma diagnosis by means of a Langmuir probe, contamination of the electrode is a quite serious problem. In order to get reliable data of space plasma, cleaning of the electrode is an essential requirement. The instrument which is not influenced by the electrode contamination must be developed. In this paper we recommend two types of probes; one is a glass-sealed Langmuir probe and the other is an electron temperature probe. These two probes are free from contaminaton effects and can give reliable electron density and temperature in the ionospheric plasma. Finally this paper briefly discusses the application of the Langmuir probe to polar ionosphere study.", "subitem_description_type": "Other"}]}, "item_1_identifier_registration": {"attribute_name": "ID登録", "attribute_value_mlt": [{"subitem_identifier_reg_text": "10.15094/00007794", "subitem_identifier_reg_type": "JaLC"}]}, "item_1_publisher_22": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "国立極地研究所"}]}, "item_1_source_id_13": {"attribute_name": "雑誌書誌ID", "attribute_value_mlt": [{"subitem_source_identifier": "AN00181831", "subitem_source_identifier_type": "NCID"}]}, "item_1_source_id_20": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00857289", "subitem_source_identifier_type": "ISSN"}]}, "item_1_subject_21": {"attribute_name": "国際十進分類法", "attribute_value_mlt": [{"subitem_subject": "551.510.535/.537", "subitem_subject_scheme": "UDC"}]}, "item_1_text_10": {"attribute_name": "著者所属(英)", "attribute_value_mlt": [{"subitem_text_language": "en", "subitem_text_value": "Institute of Space and Aeronautical Science, University of Tokyo"}, {"subitem_text_language": "en", "subitem_text_value": "Institute of Space and Aeronautical Science, University of Tokyo"}, {"subitem_text_language": "en", "subitem_text_value": "Radio Research Laboratory"}]}, "item_1_text_9": {"attribute_name": "著者所属(日)", "attribute_value_mlt": [{"subitem_text_value": "東京大学宇宙航空研究所"}, {"subitem_text_value": "東京大学宇宙航空研究所"}, {"subitem_text_value": "郵政省電波研究所"}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "1975-03-01"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "KJ00002476794.pdf", "filesize": [{"value": "4.5 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_6", "mimetype": "application/pdf", "size": 4500000.0, "url": {"label": "KJ00002476794", "url": "https://nipr.repo.nii.ac.jp/record/7794/files/KJ00002476794.pdf"}, "version_id": "96b9eb04-c752-40bb-9dd6-56330e00ad4e"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "departmental bulletin paper", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定"}, {"subitem_title": "Measurement of Electron Density and Temperature by Means of Contamination-Free Probe", "subitem_title_language": "en"}]}, "item_type_id": "1", "owner": "4", "path": ["958"], "permalink_uri": "https://doi.org/10.15094/00007794", "pubdate": {"attribute_name": "公開日", "attribute_value": "1975-03-01"}, "publish_date": "1975-03-01", "publish_status": "0", "recid": "7794", "relation": {}, "relation_version_is_last": true, "title": ["Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定"], "weko_shared_id": 4}
Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定
https://doi.org/10.15094/00007794
https://doi.org/10.15094/000077942967c5db-a910-4a0d-8f4d-a4311be33f99
名前 / ファイル | ライセンス | アクション |
---|---|---|
KJ00002476794 (4.5 MB)
|
Item type | 紀要論文(ELS) / Departmental Bulletin Paper(1) | |||||
---|---|---|---|---|---|---|
公開日 | 1975-03-01 | |||||
タイトル | ||||||
タイトル | Glass-Sealed Langmuir ProbeおよびElectron Temperature Probeによる極域電離層の観測 : 電子密度・温度の測定 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Measurement of Electron Density and Temperature by Means of Contamination-Free Probe | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
ID登録 | ||||||
ID登録 | 10.15094/00007794 | |||||
ID登録タイプ | JaLC | |||||
ページ属性 | ||||||
内容記述タイプ | Other | |||||
内容記述 | P(論文) | |||||
論文名よみ | ||||||
その他のタイトル | GLASS-SEALD LAMGMIR PROBE オヨビ ELECTRON TEMPEATURE PROBE ニヨル キョクイキ デンリソウ ノ カンソク デンシ ミツド・オンド ノ ソクイテイ | |||||
著者名(日) |
小山, 孝一郎
× 小山, 孝一郎× 平尾, 邦雄× 宮崎, 茂 |
|||||
著者名(英) |
OYAMA, Koichiro
× OYAMA, Koichiro× HIRAO, Kunio× MIYAZAKI, Shigeru |
|||||
著者所属(日) | ||||||
東京大学宇宙航空研究所 | ||||||
著者所属(日) | ||||||
東京大学宇宙航空研究所 | ||||||
著者所属(日) | ||||||
郵政省電波研究所 | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Aeronautical Science, University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Aeronautical Science, University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Radio Research Laboratory | ||||||
抄録(日) | ||||||
内容記述タイプ | Other | |||||
内容記述 | DCラングミュアプローブによる電離層電子密度・温度の測定において,電極表面の汚染の影響は,まず第一に留意しなければならない.本論文では,この電極汚染の影響をさけて信頼し得るデータを得るために開発されたガラス封入型DCラングミュアプロ-ブ(Glass-sealed Langmuir probe),および電子温度プローブ(Electron temperature probe)について概説し,あわせて,極域電離層研究への応用の可能性をさぐる. | |||||
抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | In plasma diagnosis by means of a Langmuir probe, contamination of the electrode is a quite serious problem. In order to get reliable data of space plasma, cleaning of the electrode is an essential requirement. The instrument which is not influenced by the electrode contamination must be developed. In this paper we recommend two types of probes; one is a glass-sealed Langmuir probe and the other is an electron temperature probe. These two probes are free from contaminaton effects and can give reliable electron density and temperature in the ionospheric plasma. Finally this paper briefly discusses the application of the Langmuir probe to polar ionosphere study. | |||||
雑誌書誌ID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00181831 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00857289 | |||||
書誌情報 |
南極資料 巻 52, p. 78-91, 発行日 1975-03 |
|||||
国際十進分類法 | ||||||
主題Scheme | UDC | |||||
主題 | 551.510.535/.537 | |||||
出版者 | ||||||
出版者 | 国立極地研究所 |